Scanning tunne領(lǐng) microscopy produced dramatic images of atomic lattices and atomic force microscopy broadened the technology to non-conductive surfaces. Development of atomic force microscopes has allowed scientists and engineers to see structure and detail with unprecedented resolution and without the need for rigorous sample preparation. Several advances have further extended this techniques utility to a wide range of applications. Tapping Mode permits imaging of soft materials without damage to the sample and Lift Mode allows separate but simultaneous imaging of topography and other parameters, such as magnetic or electric forces, without cross-contamination. Phase Imaging has opened up the capability for mapping of surface compositional variations. 布魯克Innova 掃描探針顯微鏡
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